The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2009

Filed:

Sep. 21, 2006
Applicant:

Hiroshi Fujita, Saitama, JP;

Inventor:

Hiroshi Fujita, Saitama, JP;

Assignee:

Fujinon Corporation, Saitama-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

OCT measuring that uses an optical fiber and is capable of preventing degradation in the resolution due to the wavelength dispersion of the optical fiber. For controlling the optical path length of the reference light in the OCT measuring, the following are provided: a diffraction grating element for dispersing the reference light; a collimator lens for collimating the dispersed reference light; and a reflection mirror for reflecting the reference light transmitted through the collimator lens back to the collimator lens and inputting to the diffraction grating element. The reflection mirror pivots on a position offset from the optical axis of the collimator lens. The diffraction grating element is tilted with respect to the optical axis of the collimator lens to compensate for the wavelength dispersion of the optical fiber.


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