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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7511759 B1

PDFFull Text
Expired
Date of Patent:
Mar. 31, 2009

Filed:

Feb. 10, 2005

Image pickup apparatus, control method thereof, control program thereof and storage medium, with movement of focus lens on basis of evaluation values extracted by long period scan upon failure of detection of peak position by short period scan

Applicants:

Hisao Yagi, Matsudo, JP;

Satoshi Kimoto, Kawasaki, JP;

Inventors:

Hisao Yagi, Matsudo, JP;

Satoshi Kimoto, Kawasaki, JP;

Assignee:

Canon Kabushiki Kaisha, Tokyo, JP;

Attorney:

Fitzpatrick, Cella, Harper & Scinto

Primary Examiner:

Sinh N Tran

Assistant Examiner:

Christopher K Peterson

Int. Cl.
CPC ...
G03B 13/00 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
Abstract

Evaluation values are extracted at first timings with respect to a movement of a focus lens, and evaluation values are extracted at second timings having higher frequency than the first timings on the basis of the evaluation values extracted at the first timings. Then, even if the evaluation values have been extracted at the second timings in such a way, the focus lens is moved on the basis of the evaluation values extracted at the first timings. Thereby, the fast and suitable movement of AF can be implemented.

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Quick Actions:

Yagi, Hisao. (2009). Image pickup apparatus, control method thereof, control program thereof and storage medium, with movement of focus lens on basis of evaluation values extracted by long period scan upon failure of detection of peak position by short period scan (U.S. Patent No. 7511759). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7511759

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