The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2009

Filed:

Feb. 08, 2007
Applicants:

Daniel J. Friedman, Sleepy Hollow, NY (US);

Yong Liu, Cambridge, MA (US);

Woogeun Rhee, Beijing, CN;

Inventors:

Daniel J. Friedman, Sleepy Hollow, NY (US);

Yong Liu, Cambridge, MA (US);

Woogeun Rhee, Beijing, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03L 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

An instantaneous phase error detector (IPED) and method includes a first gate configured to logically OR output phase error signals as data to a first latch, and a second gate configured to logically combine the output phase error signals to clock the first latch. A delay element delays to the data to the first latch where the output of the first latch provides instantaneous phase error change information. A second latch is coupled to the output phase error signals to output a lead/lag signal to indicate which of the output phase error signals is leading. A phase-locked loop employing the output of the IPED is also disclosed along with static phase measurement and jitter optimization features.


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