The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2009

Filed:

Jan. 29, 2008
Applicants:

Kee Chee Tiew, Richardson, TX (US);

Brett Smith, McKinney, TX (US);

Inventors:

Kee Chee Tiew, Richardson, TX (US);

Brett Smith, McKinney, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus to test power transistors of integrated circuits on a wafer are disclosed. An example method comprises measuring a drain-source on resistance of a first transistor, measuring a drain-source on resistance of a second transistor, computing a scaling ratio between the transistors based on the drain-source on resistances of the transistors, measuring a first current indicative of an over-current condition of the first transistor, and computing a second current of the second transistor based on the current of the second transistor and the scaling ratio.


Find Patent Forward Citations

Tiew, Kee. (2009). Methods and apparatus to test power transistors (U.S. Patent No. 7511527). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7511527

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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