The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2009
Filed:
Nov. 13, 2003
Torsten Pechstein, Radebeul, DE;
Katrin Scholz, Bobritzsch, DE;
Sven Häertig, Frankenhain, DE;
Abstract
A method for monitoring a reference half cell, which forms with a measuring half cell a potentiometric measuring point for determining and/or monitoring an ion concentration of a medium. The ion concentration of the mediums determined on the basis of at least one measurement signal determined in a measuring circuit, between the measuring half cell and the reference half cell. According to the invention, the measuring point is operated intermittently in an operating mode and in a test mode, wherein, in the operating mode, the ion concentration is measured and wherein, in the test mode, the proper functioning of the reference half cell is checked.