The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2009

Filed:

May. 11, 2007
Applicant:

Van J. Wedeen, Somerville, MA (US);

Inventor:

Van J. Wedeen, Somerville, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A diffusion-weighted MRI pulse sequence employs a two-dimensional diffusion weighting gradient that is sensitive to spin diffusion in a plane defined by two orthogonal gradients to acquire an image. The resulting magnitude image indicates the location of neuronal fibers perpendicular to this plane and by repeating the acquisition with the plane oriented at different angles, neuronal fibers extending through the field of view at any angle are detected. The magnitude images are used to produce a fiber tracking image.


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Wedeen, Van. (2009). Method for measuring the microarchitecture of complex tissue with mri (U.S. Patent No. 7511494). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7511494

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