The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2009

Filed:

Sep. 19, 2006
Applicants:

Stephen Y. Chou, Princeton, NJ (US);

BO Cui, Boucherville, CA;

Christopher F. Keimel, Schenectady, NY (US);

Inventors:

Stephen Y. Chou, Princeton, NJ (US);

Bo Cui, Boucherville, CA;

Christopher F. Keimel, Schenectady, NY (US);

Assignee:

Princeton University, Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/3105 (2006.01);
U.S. Cl.
CPC ...
Abstract

A processing method for use in the fabrication of fabrication of nanoscale electronic, optical, magnetic, biological, and fluidic devices and structures, for filling nanoscale holes and trenches, for planarizing a wafer surface, or for achieving both filling and planarizing of a wafer surface simultaneously. The method has the initial step of depositing a layer of a meltable material on a wafer surface. The material is then pressed using a transparent mold while shining a light pulse through the transparent mold to melt the deposited layer of meltable material. A flow of the molten layer material fills the holes and trenches, and conforms to surface features on the transparent mold. The transparent mold is subsequently removed.


Find Patent Forward Citations

Loading…