The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2009

Filed:

Nov. 27, 2006
Applicants:

Xiaoxun Zhu, Marlton, NJ (US);

Yong Liu, Suzhou, CN;

Ka Man AU, Philadelphia, PA (US);

Rui Hou, Suzhou, CN;

Hongpeng Yu, Tianjin, CN;

Xi Tao, Suzhou, CN;

Liang Liu, Suzhou, CN;

Wenhua Zhang, Suzhou, CN;

Anatoly Kotlarsky, Holland, PA (US);

Inventors:

Xiaoxun Zhu, Marlton, NJ (US);

Yong Liu, Suzhou, CN;

Ka Man Au, Philadelphia, PA (US);

Rui Hou, Suzhou, CN;

Hongpeng Yu, Tianjin, CN;

Xi Tao, Suzhou, CN;

Liang Liu, Suzhou, CN;

Wenhua Zhang, Suzhou, CN;

Anatoly Kotlarsky, Holland, PA (US);

Assignee:

Metrologic Instruments, Inc., Blackwood, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A portable digital image capturing and processing system comprising an image formation and detection subsystem, an LED-based illumination subsystem, an automatic light exposure measurement subsystem, and an automatic illumination control subsystem. The image formation and detection subsystem has an area-type image sensing array for detecting digital images of objects formed thereon by image formation optics providing a field of view (FOV) for the system. The automatic light exposure measurement subsystem employs a photodetector operated independently from the area-type image sensing array, for automatically measuring the light exposure incident upon a selected portion of the FOV, and producing an electrical signal representative of the light exposure measurement. The automatic illumination control subsystem responds to the electrical signal and controls the duration of LED-based illumination produced from the LED-based illumination subsystem during the image capture mode.


Find Patent Forward Citations

Loading…