The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2009
Filed:
Mar. 20, 2007
Applicants:
Ichiro Shirasaka, Danville, CA (US);
Randall Jaffe, Clayton, CA (US);
Inventors:
Ichiro Shirasaka, Danville, CA (US);
Randall Jaffe, Clayton, CA (US);
Assignee:
Custom Sensors & Technologies, Inc., Moorpark, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 19/00 (2006.01); C01C 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Inertial measurement system and method in which a gyroscope is periodically dithered about an axis perpendicular to its input axis, a signal from the gyroscope is delayed to provide a delayed signal which lags the gyroscope signal by one-half of the dithering period, and the delayed signal and the signal from the gyroscope are combined to provide an output signal from which the bias has been cancelled.