The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2009
Filed:
Apr. 21, 2004
Edward Triou, Jr., Duvall, WA (US);
Andre Milbradt, Snoqualmie, WA (US);
Osarumwemse U. Agbonile, Bothell, WA (US);
Affan Arshad Dar, Redmond, WA (US);
Edward Triou, Jr., Duvall, WA (US);
Andre Milbradt, Snoqualmie, WA (US);
Osarumwemse U. Agbonile, Bothell, WA (US);
Affan Arshad Dar, Redmond, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Test result data can be classified across multiple tests, test scenarios, and lab runs. Test result files can be parsed by extracting information from them. Extracted information can be compared to failure information in a database. If a match is found, the extracted information can be linked to the failure, creating a history for each failure. New failures can be identified when no match is found. Failure data can be cross-referenced to further aid in results analysis. For each failure, lists of useful information can be accessed. Analysis information can be associated with failures, for example whether the failure is new, occurred previously, is for a different reason than expected, or has been added to a baseline of expected failures. A Graphic User Interface ('GUI') is also provided to expose the analyzed results to the result analyzers.