The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2009

Filed:

Oct. 29, 2004
Applicants:

Vikas Agarwal, New Delhi, IN;

William P. Horn, Scarsdale, NY (US);

Arun Kumar, New Delhi, IN;

Inventors:

Vikas Agarwal, New Delhi, IN;

William P. Horn, Scarsdale, NY (US);

Arun Kumar, New Delhi, IN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for collecting, aggregating, and composing metrics and a computer system comprises a producer application adapted to periodically generate metrics comprising state information of the producer application; a metric engine adapted to aggregate the metrics; and a consumer application adapted to receive the aggregated metrics, wherein the metric engine is further adapted to produce new metrics in accordance with desired requirements of the consumer application. The computer system further comprises a metric service policy adapted to provide definitions of the metrics generated from the producer application and desired requirements of the consumer application, wherein the metric service policy is adapted to establish an executable set of actions for producing the new metrics from the generated metrics, wherein the metric service policy is adapted to be executable by the metric engine, and wherein multiple metric service policies are simultaneously executable by the metric engine.


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