Method of refining statistical pattern recognition models and statistical pattern recognizers

Abstract

A device () performs statistical pattern recognition using model parameters that are refined by optimizing an objective function that includes a term for many items of training data for which recognition errors occur wherein each term depends on a relative magnitude of a first score for a recognition result for an item of training data and a second score calculated by evaluating a statistical pattern recognition model identified by a transcribed identity of the training data item with feature vectors extracted from the item of training data. The objective function does not include terms for items of training data for which there is a gross discrepancy between a transcribed identity and a recognized identity. Gross discrepancies can be detected by probability score or pattern identity comparisons. Terms, of the objective function are weighted based on the type of recognition error and weights can be increased for high priority patterns.