The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7509097 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 24, 2009

Filed:

Feb. 17, 2006
Applicants:

Masataka Irie, Osaka, JP;

Akifumi Nagao, Osaka, JP;

Takeshi Yoshida, Osaka, JP;

Taro Mikami, Osaka, JP;

Inventors:

Masataka Irie, Osaka, JP;

Akifumi Nagao, Osaka, JP;

Takeshi Yoshida, Osaka, JP;

Taro Mikami, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining a measurement time period for measuring a propagation environment in a wireless station set having a plurality of wireless stations, between which wireless communication is made using a channel selected from a plurality of channels different in frequency. The method includes the steps of: obtaining a measurement time period in another wireless station set having a plurality of wireless stations; and determining the measurement time period in the own wireless station set so as to have a time period that does not overlap the obtained measurement time period.


Find Patent Forward Citations

Irie, Masataka. (2009). Method for determining a measurement time period (U.S. Patent No. 7509097). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7509097

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