The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2009
Filed:
Sep. 13, 2006
Yasuyuki Unno, Irvine, CA (US);
Yasuyuki Unno, Irvine, CA (US);
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
At least one exemplary embodiment is directed to detection aperture array which includes a shield layer; and a plurality of apertures, where the plurality of apertures are formed in the shield layer and filled with a first medium having an effective index of refraction, wherein the plurality of apertures includes at least two apertures separated by a pitch, wherein the plurality of apertures has a measurement value wherein the measurement value includes at least one of the effective refractive index and a pitch value, wherein the measurement value is changed so that TM and TE modes in incident image light passes through the plurality of apertures with about the same transmittance level, wherein when the measurement value is the pitch value then the TM and TE transmittance level are about the same when an angle of incidence of an image light varies.