The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2009

Filed:

Jun. 02, 2008
Applicant:

Hidekazu Shimomura, Yokohama, JP;

Inventor:

Hidekazu Shimomura, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); B41J 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical scanning device includes plural light source devices, a deflecting device having deflecting surfaces, an input optical system and a plurality of imaging optical systems, wherein a plurality of scan surfaces are simultaneously scanned by the deflecting device, wherein each of the plurality of imaging optical systems includes at least one transmission type imaging optical element and at least one reflection optical element, wherein each of at least two light beams scanningly deflected by the different deflecting surfaces of the deflecting device passes through the at least one transmission type imaging optical element constituting the imaging optical system and is thereafter reflected by the at least one reflection optical element and, subsequently, it passes again through the transmission type imaging optical element, and wherein, after passing again through the transmission type imaging optical element, the at least two light beams scanningly deflected by the different deflection surfaces of the deflecting means intersect with each other within a sub-scan section.


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