The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2009

Filed:

Mar. 25, 2008
Applicant:

Shohei Matsuoka, Tokyo, JP;

Inventor:

Shohei Matsuoka, Tokyo, JP;

Assignee:

Hoya Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A multi-beam scanning optical system configured to scan a plurality of laser beams on a scanned surface in a predetermined scanning direction includes a light source emitting a plurality of laser beams from respective laser emitters spaced from each other in the predetermined scanning direction, a diverging property changing element changing a diverging property of each of the emitted laser beams, a deflector configured to be sine-functionally oscillated and to deflect each of the laser beams with the diverging property thereof as changed so as to scan each of the laser beams on the scanned surface in the predetermined scanning direction, and a scanning speed controlling element configured to control a scanning speed at which each of the laser beams deflected by the deflector is scanned on the scanned surface. The multi-beam scanning optical system is configured to satisfy a predetermined condition.


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