The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2009
Filed:
Jul. 19, 2007
Shoude Chang, Ottawa, CA;
Costel P. Flueraru, Ottawa, CA;
Sherif S. Sherif, Gloucester, CA;
National Research Council of Canada, Ottawa, Ontario, CA;
Abstract
The invention provides an interferometric system and method for quadrature detection of optical characteristics of a sample. The system includes a Mach-Zehnder interferometer providing a variable optical delay between light collected from the sample and reference light. The Mach-Zehnder interferometer has an output M×N coupler with N≧3 output ports. Two differential detectors, each having two input ports coupled to a different two of the N output ports of the M×N coupler, produce first and second electrical signals having an interferometric phase shift. A processor is provided for computing real and imaginary parts of a complex refractive index of the sample from the first and second electrical signals by using complex deconvolution.