The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2009
Filed:
Sep. 14, 2006
Raymond Todd Lines, Rochester, NY (US);
Norman A. Lopez, Rochester, NY (US);
Joseph L. Lippert, Rochester, NY (US);
Darryl Guy Murdock, Penfield, NY (US);
Dawn Lenz, Erie, CO (US);
Michael Stoogenke, Tully, NY (US);
Matthew C. Severski, Fairport, NY (US);
Hooshmand M. Kalayeh, Pittsford, NY (US);
Raymond Todd Lines, Rochester, NY (US);
Norman A. Lopez, Rochester, NY (US);
Joseph L. Lippert, Rochester, NY (US);
Darryl Guy Murdock, Penfield, NY (US);
Dawn Lenz, Erie, CO (US);
Michael Stoogenke, Tully, NY (US);
Matthew C. Severski, Fairport, NY (US);
Hooshmand M. Kalayeh, Pittsford, NY (US);
ITT Manufacturing Enterprises, Inc., Wilmington, DE (US);
Abstract
Methods and systems for obtaining a target fluid map of a survey area using a differential absorption LIDAR (DIAL) system are provided. Pulse bursts are transmitted toward the survey area, where each pulse burst includes an off-line pulse and at least one on-line pulse. Pulse bursts, each being associated with a measurement point, are received from the survey area. A concentration path length (CPL) corresponding to a respective on-line pulse, a spatial location associated with the CPL, and an error associated with the CPL are determined for each measurement point. The CPL for each measurement point is arranged within the survey area to form the target fluid map.