The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2009

Filed:

May. 24, 2007
Applicants:

Timothy J. Vitanza, Mars, PA (US);

Rebecca Webb Ross, Apollo, PA (US);

Regis J. Nero, Jr., Export, PA (US);

Inventors:

Timothy J. Vitanza, Mars, PA (US);

Rebecca Webb Ross, Apollo, PA (US);

Regis J. Nero, Jr., Export, PA (US);

Assignee:

Tollgrade Communications, Inc., Wilmington, DE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); H04B 3/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for determining insertion loss of a telephone line under test (LUT) predicts a length d of the LUT at each of a number of discrete frequencies. The system determines for each predicted length d a running standard deviation that is a function of the predicted length(s) d at and below the frequency where the predicted length d was determined; and determines a mean length (dm) of the LUT as a function of the lengths d of the LUT determined for each frequency at and below the pair of adjacent frequencies where the largest difference between running standard deviations occurs. The system determines a gauge of the LUT as a function of the running standard deviation the one of said pair of adjacent frequencies; and determines an insertion loss value of the LUT as a function of the gauge and the mean length dm.


Find Patent Forward Citations

Loading…