The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2009
Filed:
Mar. 03, 2004
Alberto Orfao DE Matos Correia E Valle, Salamanca, ES;
Carlos Eduardo Pedreira, Rio de Janeiro, BR;
Elaine Sobral Da Costa, Rio de Janeiro, BR;
Alberto Orfao De Matos Correia E Valle, Salamanca, ES;
Carlos Eduardo Pedreira, Rio de Janeiro, BR;
Elaine Sobral Da Costa, Rio de Janeiro, BR;
University of Salamanca, Salamanca, ES;
Abstract
A method for detecting aberrant phenotypes expressed by neoplastic cells includes the steps of: 1) staining one or more normal/reactive samples and one neoplastic sample with multiple combinations of monoclonal antibodies, 2) measuring fluorescence emissions associated to the stained cells, 3) storing two independent list mode data files of information on light scatter and fluorescence characteristics of each cell, 4) creating new data files by mixing list mode data from the data file containing information the neoplastic sample into the data file containing information on the normal samples, 5) defining corresponding to normal cells and areas corresponding to empty spaces in normal/reactive samples that may be occupied by tumor cells in neoplastic samples, 6) identifying events corresponding to neoplastic cells and events corresponding to normal cells coexisting in a multidimensional space, and 7) establishing the most relevant phenotypic aberrations displayed by the neoplastic cells as compared to their normal counterpart.