The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2009
Filed:
Sep. 26, 2007
Masanao Fujieda, Toyohashi, JP;
Masanao Fujieda, Toyohashi, JP;
Nidek Co., Ltd., Gamagori, JP;
Abstract
An ophthalmic apparatus capable of easily checking opacity of a crystalline lens, and more appropriately evaluating a measurement result on eye refractive power distribution or wavefront aberration, which includes a measurement optical system for projecting measurement light onto a fundus of an examinee's eye and photo-receiving the measurement light reflected from the fundus so as to measure eye refractive power distribution or wavefront aberration, an illumination for an anterior segment, a first image-pickup optical system for picking up an image of the anterior segment, a projection optical system for projecting photographing light onto the fundus, a second image-pickup optical system for photo-receiving the photographing light so as to pick up a diaphanoscopic image, a monitor, a calculation part for obtaining a mapping image based on a result of the measurement, and a control part for displaying the mapping image and the diaphanoscopic image on one screen of the monitor.