The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2009

Filed:

Feb. 06, 2007
Applicant:

Tsuguo Nanjo, Toyohashi, JP;

Inventor:

Tsuguo Nanjo, Toyohashi, JP;

Assignee:

Nidek Co., Ltd., Gamagori-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A retinal function measurement apparatus capable of measuring a retinal function accurately and precisely. The apparatus has a first image obtaining optical system for obtaining a tomographic image of a fundus by optical coherence tomography using low coherent light, the optical system including a light source emitting the low coherent light, a scanning unit scanning measurement light being a part of the emitted low coherent light on the fundus, an interference optical system for synthesizing the measurement light reflected from the fundus and reference light being a part of the emitted low coherent light to interfere, and a first photodetector photo-receiving the interfered light, a stimulating light irradiation optical system for performing irradiation of stimulating light onto the fundus, and an image processing unit obtaining information on a retinal function by performing processing on a first tomographic image and a second tomographic image before/after the irradiation of the stimulating light.


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