The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2009
Filed:
Apr. 17, 2008
John Michael Cuffe, Reedsville, PA (US);
Klaus Peter Busch, Rodenbach, DE;
Scott Allen Herbster, Middleburg, PA (US);
John Michael Cuffe, Reedsville, PA (US);
Klaus Peter Busch, Rodenbach, DE;
Scott Allen Herbster, Middleburg, PA (US);
GE Inspection Technologies, LP, Lewistown, PA (US);
Abstract
The invention provides an ultrasonic object inspection system for measuring the physical properties of a test object which includes a pulse generator for sending an electrical pulse signal to a transducer. The transducer then applies an ultrasonic signal to the test object and receives an ultrasonic echo signal from the test object which is then converted by the transducer to an electrical echo signal for sending to a signal processing circuit. The signal processing circuit includes a plurality of signal processing paths with each path scaling the electrical echo signal to a different degree and including a respective analog to digital converter for converting the electrical echo signal to a digital electrical echo signal. The signal processing circuit further includes a logic circuit for selecting the output of the respective analog to digital converter that provides the digital echo signal having the greatest amplitude without exceeding a predetermined saturation threshold.