The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2009
Filed:
Mar. 30, 2004
Leonardus Antonius Maria Brouwers, Beesel, NL;
Robertus Johanes Adam Gorter, Utrecht, NL;
Nico Antonius Johannes Hubertus Boonen, Geldrop, NL;
Leonardus Antonius Maria Brouwers, Beesel, NL;
Robertus Johanes Adam Gorter, Utrecht, NL;
Nico Antonius Johannes Hubertus Boonen, Geldrop, NL;
Abstract
A device for measuring the tack of materials, comprising a first cylinder () included in a fixed frame () and a second cylinder () included in a movable yoke (), whose outer surfaces contact each other via a layer of the material to be tested for tack (). The yoke () is connected with the frame () via a connecting element () movable about a center. A force sensor () is included between the yoke and the movable connecting element or between the frame and the movable connecting element. The output of the force sensor () is connected with processing means () for processing the measuring signal delivered by the force sensor into a material-specific tack value. In a first calibration step, the first cylinder is coupled with a static mass () via coupling means (). A first correction value, based on the measuring signal delivered by the force sensor, is stored in the processing means. During a second calibration step, the first and second cylinder are contacted with each other without material to be measured. A second correction value, based on the measuring signal delivered by the force sensor, is stored in the processing means. In an actual measuring step, the first and the second cylinder are coupled via a layer of the material to be tested. The measuring signal delivered by the force sensor is processed as a measuring value, taking into account the stored first and/or second correction value.