The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2009
Filed:
Oct. 21, 2004
Applicants:
Stephen Paul Hunter, Bristol, GB;
Hugo George Derrick, Bristol, GB;
David Roberts Mcmurtry, Dursley, GB;
Inventors:
Stephen Paul Hunter, Bristol, GB;
Hugo George Derrick, Bristol, GB;
David Roberts McMurtry, Dursley, GB;
Assignee:
Renishaw PLC, Gloucestershire, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G12B 21/24 (2006.01); G01B 5/00 (2006.01); G01B 5/12 (2006.01);
U.S. Cl.
CPC ...
Abstract
A metrology instrument, such as a probe, probe head, stylus or stylus arm, for mounting on a coordinate position apparatus. The metrology instrument is at least partially constructed from at least one sheet of thermally stable metallic material which is folded to form a three dimensional structure. The at least one sheet of thermally stable material is utilized in the metrology loop of the metrology instrument.