The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2009
Filed:
Nov. 17, 2004
Sowmya Subramanian, Mountain View, CA (US);
Larry Dean Harris, Belmont, CA (US);
Sandeep Khemani, Fremont, CA (US);
Thomas W. Nickerson, Independence, CA (US);
George A. Buzsaki, Fremont, CA (US);
Michael DE Groot, Cupertino, CA (US);
Sowmya Subramanian, Mountain View, CA (US);
Larry Dean Harris, Belmont, CA (US);
Sandeep Khemani, Fremont, CA (US);
Thomas W. Nickerson, Independence, CA (US);
George A. Buzsaki, Fremont, CA (US);
Michael De Groot, Cupertino, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Methods and apparatus for enabling the framework and the application code associated with an application programming interface (API) to be efficiently and comprehensively tested are disclosed. According to one aspect of the present invention, a structure that defines an API test in declarative metadata includes an entity to be tested, a first metadata arrangement, and a second metadata arrangement. The first metadata arrangement includes any data to be used when the entity is tested, and the second metadata arrangement includes any expected outputs associated with testing the entity.