The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2009

Filed:

Jan. 12, 2005
Applicants:

Titania M. Gupta, Hawthorne, NY (US);

Laurent D. Hasson, New York, NY (US);

Inventors:

Titania M. Gupta, Hawthorne, NY (US);

Laurent D. Hasson, New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system, method and program product for generating artifacts that can convert back and forth between non-EMF (Eclipse Modeling Framework) objects and EMF-based objects in an EMF-based runtime environment such as Web Data Objects (WDO) or Service Data Objects (SDO). Included is a system for inputting one or more non EMF application classes such as Java Beans and generating artifacts that include: a source meta model (ecore) that describes the data model defined by the input application classes; an EMap file that contains mappings between the classes and properties of the non-EMF objects and the EMF Objects; a target meta model (ecore) which represents the source meta model as transformed by the emap mappings; and a set of java classes (Mediators and DiffHandlers) that will at runtime perform the transformation between the two environments (non-EMF and EMF based objects).


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