The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2009

Filed:

Nov. 17, 2005
Applicants:

Ranjani Ramamurthy, Bellevue, WA (US);

Shriram Lakshmi, Redmond, WA (US);

Raja D. Venugopal, Redmond, WA (US);

Inventors:

Ranjani Ramamurthy, Bellevue, WA (US);

Shriram Lakshmi, Redmond, WA (US);

Raja D. Venugopal, Redmond, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A distributed testing system for testing exception handling code paths is provided. The system may include multiple workstations configured to distributively test an executable component for exception handling. Each workstation includes a local data structure with data indicating code paths that have been traversed by a test performed by the workstation. The system includes a central data structure that is accessible by the workstations. By synchronizing with the central data structure, the local data structures can include data about code paths that have been traversed by the workstations in the system. Each workstation may use the synchronized, local data structure to determine previously traversed code paths and use this information to configure further tests.


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