The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2009

Filed:

Sep. 13, 2005
Applicants:

Laura Ioana Apostoloiu, Markhanm, CA;

Philip Arthur Day, Thornhill, CA;

Behrad Ghazizadeh, Markham, CA;

Inventors:

Laura Ioana Apostoloiu, Markhanm, CA;

Philip Arthur Day, Thornhill, CA;

Behrad Ghazizadeh, Markham, CA;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Atomic testing of a multiplicity of scenarios includes generating a listing of interacting scenarios which are likely to cause a failure, and testing ones of the scenarios not included in the listing according to a binary search strategy to identify a subset of the scenarios as a source of failure among the scenarios. Additionally, the listing can be updated with newly identified interacting scenarios which are likely to cause a failure.


Find Patent Forward Citations

Apostoloiu, Laura. (2009). Automated atomic system testing (U.S. Patent No. 7506211). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7506211

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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