The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2009

Filed:

Jan. 28, 2005
Applicants:

Daisaku Takahashi, Kawasaki, JP;

Yukiko Yoshii, Kawasaki, JP;

Yoshiaki Kaku, Sapporo, JP;

Hitoshi Ono, Kawasaki, JP;

Hiroshi Suzuki, Kawasaki, JP;

Chiaki Kawashima, Kawasaki, JP;

Inventors:

Daisaku Takahashi, Kawasaki, JP;

Yukiko Yoshii, Kawasaki, JP;

Yoshiaki Kaku, Sapporo, JP;

Hitoshi Ono, Kawasaki, JP;

Hiroshi Suzuki, Kawasaki, JP;

Chiaki Kawashima, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki-Shi, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is provided to point out which software program is causing a problem. Event records are collected from target objects being monitored. An event group is then produced by grouping the collected event records. The event group is compared with a plurality of pattern definition groups in terms of occurrence patterns of event records, where each pattern definition group defines a pattern of event records that would be produced upon occurrence of a particular problem. Subsequently a troubleshooting record is extracted. This troubleshooting record has previously been associated with a pattern definition group resembling the event group in terms of occurrence patterns of event records.


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