The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2009
Filed:
Sep. 03, 2002
Guillermo Alvarez, San Jose, CA (US);
Fabian E. Bustamante, Atlanta, GA (US);
Ralph Becker-szendy, Los Gatos, CA (US);
John Wilkes, Palo Alto, CA (US);
Guillermo Alvarez, San Jose, CA (US);
Fabian E. Bustamante, Atlanta, GA (US);
Ralph Becker-Szendy, Los Gatos, CA (US);
John Wilkes, Palo Alto, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
A technique for programmatically obtaining experimental measurements for model construction. A user provides criteria for the model, such as computational algorithms which characterize behavior of the real system, specifications of experiments to be performed on the real system for collecting experimental data from the real system, an identification of sought parameters which are to be derived from results of the experiments and desired tolerance constraints on the sought parameters. From experimental data collected from the real system and from the provided criteria, the inventive method and apparatus programmatically determines in an iterative loop which additional experiments are to be performed in order to achieve the desired tolerance constraints. After one or more iterations of the loop, the values for the sought parameters are determined within the desired tolerance constraints.