The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2009
Filed:
Aug. 17, 2007
Drew Schulke, Austin, TX (US);
Barry Kahr, Austin, TX (US);
Vinod Makhija, Austin, TX (US);
Adolfo Montero, Austin, TX (US);
Hasnain Shabbir, Round Rock, TX (US);
Drew Schulke, Austin, TX (US);
Barry Kahr, Austin, TX (US);
Vinod Makhija, Austin, TX (US);
Adolfo Montero, Austin, TX (US);
Hasnain Shabbir, Round Rock, TX (US);
Dell Products L.P., Round Rock, TX (US);
Abstract
Thermal subsystems of manufactured information handling systems are tested for compliance with desired parameters by running a thermal diagnostics module in firmware during one or more manufacturing activities performed on the information handling system. The thermal diagnostics module monitors and stores one or more thermal parameters detected at the information handling system, such as the maximum temperature zone detected during a manufacturing activity. The stored thermal parameter is read after the manufacturing activity and compared with an expected value to determine the status of the thermal subsystem. For instance, an information handling system maximum operating temperature is detected by firmware running on an embedded controller during imaging of a hard disk drive and fails thermal testing if the detected maximum operating temperature exceeds a predetermined value, such as a value that would not be reached if the thermal subsystem functioning properly.