The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2009
Filed:
May. 17, 2007
David B. Board, Boca Raton, FL (US);
David B. Board, Boca Raton, FL (US);
Curtiss-Wright Flow Control Corporation, Falls Church, VA (US);
Abstract
A statistical process, and system for implementing the process, is described for the analysis of stress waves generated in operating machinery or equipment. This technique is called Probabilistic Stress Wave Analysis. The process is applied to a population of individual 'feature' values extracted from a digitized time waveform (such as a 2 second Stress Wave Pulse Train, or a 2 month history of Stress Wave Energy). Certain numeric descriptors of the statistical distributions of computed features are then employed as inputs to decision making routines (such as neural networks or simple threshold testing) to accurately classify the condition represented by the original time waveform data, and thereby determine a status of the operating machine/equipment.