The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2009

Filed:

Oct. 14, 2005
Applicants:

Stefan Oelckers, Berlin, DE;

Peter Schalt, Moorrege, DE;

Inventors:

Stefan Oelckers, Berlin, DE;

Peter Schalt, Moorrege, DE;

Assignee:

Möller-Wedel GmbH, Wedel, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method for optimized setting of light power at the object plane in the case of reflected light microscopes, surgical microscopes in particular. In accordance with the invention, a check is performed as to whether or to what extent thermal danger or damage to the illuminated sections is relevant in order to regulate, in particular limit, the light output of a light source upon a threshold being reached.


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