The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2009
Filed:
Oct. 02, 2003
Applicant:
Ralf Krueger, Griedel, DE;
Inventor:
Ralf Krueger, Griedel, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/32 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention concerns an apparatus for implementing phase-contrast or modulation-contrast observation on microscopes with the aid of a modulator () arranged in each pupil plane in the observation beam path and containing at least one layer modifying the phase or amplitude, and of a stop () arranged in the illumination beam path. For stepless adaptation of the phase shift, the modulator () is mounted tiltably. The invention further concerns a method for implementing a defined phase shift.