The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2009
Filed:
Feb. 24, 2005
Cameron G. Massey, Hawthorne, CA (US);
William Barvosa-carter, Ventura, CA (US);
Hans Bruesselbach, Monte Nido, CA (US);
Robert Doty, Los Angeles, CA (US);
Guillermo Herrera, Winnetka, CA (US);
Michael Nolan, Hermosa Beach, CA (US);
Cameron G. Massey, Hawthorne, CA (US);
William Barvosa-Carter, Ventura, CA (US);
Hans Bruesselbach, Monte Nido, CA (US);
Robert Doty, Los Angeles, CA (US);
Guillermo Herrera, Winnetka, CA (US);
Michael Nolan, Hermosa Beach, CA (US);
The Boeing Company, Chicago, IL (US);
Abstract
An optical metrology system having an optical metrology sensor assembly and a target is disclosed. The optical metrology sensor assembly transmits a light beam to the target and then uses the reflected beam from the target to determine the position of the target in three dimensions. The optical metrology sensor can comprise a light source, a ranging device, and a two-dimensional sensor. The optical metrology system is suitable for applications such as determining the position, orientation, and shape of a spacecraft antenna, so as to facilitate movement thereof to enhance operation of the antenna.