The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2009
Filed:
May. 12, 2006
Thomas Zettler, Berlin, DE;
Guenther Strassburger, Lostau, DE;
Armin Dadgar, Berlin, DE;
Alois Krost, Berlin, DE;
Thomas Zettler, Berlin, DE;
Guenther Strassburger, Lostau, DE;
Armin Dadgar, Berlin, DE;
Alois Krost, Berlin, DE;
Laytec GmbH, Berlin, DE;
Abstract
The invention relates to a device and a method for the measurement of the curvature of a surface (), which is more exact and less expensive than prior art devices. The device comprises a light source () for the irradiation of a light beam () onto the surface (), in which a birefingent element () is arranged between light source () and surface (), in which furthermore a detector () is arranged for the detection of the partial beams (), that are reflected from the surface (), and at least one main axis () of the birefringent element () is positioned with respect to the light beam () of the light source () in such a way, that the light beam () of the light source () is split up into at least two parallel beams ().