The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2009
Filed:
Apr. 10, 2006
Anis Zribi, Rexford, NY (US);
Stacey Joy Kennerly, Niskayuna, NY (US);
Glenn Scott Claydon, Wynantskill, NY (US);
Long Que, Rexford, NY (US);
Ayan Banerjee, Bangalore, IN;
Shankar Chandrasekaran, Tamil Nadu, IN;
Shivappa Ningappa Goravar, Karnataka, IN;
David Cecil Hays, Niskayuna, NY (US);
Anis Zribi, Rexford, NY (US);
Stacey Joy Kennerly, Niskayuna, NY (US);
Glenn Scott Claydon, Wynantskill, NY (US);
Long Que, Rexford, NY (US);
Ayan Banerjee, Bangalore, IN;
Shankar Chandrasekaran, Tamil Nadu, IN;
Shivappa Ningappa Goravar, Karnataka, IN;
David Cecil Hays, Niskayuna, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
An integrated spectrometer instrument, including an optical source formed on a chip, the optical source configured to generate an incident optical beam upon a sample to be measured. Collection optics formed on the chip are configured to receive a scattered optical beam from the sample, and filtering optics formed on the chip are configured to remove elastically scattered light from the scattered optical beam at a wavelength corresponding to the optical source. A tunable filter formed on the chip is configured to pass selected wavelengths of the scattered optical beam, and a photo detector device formed on the chip is configured to generate an output signal corresponding to the intensity of photons passed through the tunable filter.