The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2009

Filed:

Apr. 25, 2003
Applicant:

Philip Ti-fei Su, Redmond, WA (US);

Inventor:

Philip Ti-Fei Su, Redmond, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01); G06T 11/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

Various techniques are disclosed for easily and accurately estimating the amount of overlap between two or more polygons. With various examples of these techniques, a pattern of objects, such as points, is provided over the entire area of the first polygon. The amount of objects within the first polygon then is determined, as is the amount of objects within the first polygon that also are located within the second polygon. The ratio of the amount of objects located within both the first polygon and the second polygon to the total amount of objects located within the first polygon then provides an estimate of the amount of the first polygon overlapped by the second polygon.


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