The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2009

Filed:

Mar. 11, 2005
Applicants:

Evan Thrush, Menlo Park, CA (US);

Jonathan Ziebarth, Mountain View, CA (US);

James S. Harris, Jr., Stanford, CA (US);

Michael D. Mcgehee, Palo Alto, CA (US);

Inventors:

Evan Thrush, Menlo Park, CA (US);

Jonathan Ziebarth, Mountain View, CA (US);

James S. Harris, Jr., Stanford, CA (US);

Michael D. McGehee, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01); G02B 6/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical imaging system having an optical source located between the object being imaged and the sensor is provided. Such positioning of the source enables provision of compact optical imaging systems. In particular, such systems can have image widths significantly larger than the object to sensor separation. The arrangement of source, imaging assembly and sensor is such that an image of the source is not formed at the sensor. Therefore, the effect of this source positioning on the image of the object at the sensor is a reduction of intensity, as opposed to more objectionable imaging artifacts, such as spurious shadows and/or bright spots. Thus compact optical imaging systems having good image quality are provided, which enables high-fidelity imaging of object to sensor for a wide variety of applications.


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