The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2009

Filed:

Feb. 13, 2008
Applicants:

Eymard J. Chitty, Easton, CT (US);

Brian M. Taylor, Glastonbury, CT (US);

Peter C. Thomas, Cheshire, CT (US);

Daniel P. Vigliotti, Hamden, CT (US);

Geoffrey Weeks, Burton-upon-Trent, GB;

Inventors:

Eymard J. Chitty, Easton, CT (US);

Brian M. Taylor, Glastonbury, CT (US);

Peter C. Thomas, Cheshire, CT (US);

Daniel P. Vigliotti, Hamden, CT (US);

Geoffrey Weeks, Burton-upon-Trent, GB;

Assignee:

Newfrey LLC, Newark, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B21J 15/28 (2006.01); B23P 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A rivet monitoring system is provided which has a micro-strain or micro fluid pressure sensor that measures strains or pressures within a tool component. These measured signals are compared to a number of tolerance bands formed about median strain or pressure versus time curve. Various techniques are provided to analyze the measured data with respect to the tolerance bands to determine if a particular rivet set is acceptable.


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