The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2009
Filed:
Jul. 29, 2005
Atul Garg, Saratoga, CA (US);
Joe Scarpelli, Mountain View, CA (US);
Dasari Subramanyeswara Rao, Bangalore, IN;
Girish Narasimha Raghavan, Bangalore, IN;
Bopana Ganapathy, Bangalore, IN;
Anil Kumar Sondekoppa Hanumappa, Bangalore, IN;
Atul Garg, Saratoga, CA (US);
Joe Scarpelli, Mountain View, CA (US);
Dasari Subramanyeswara Rao, Bangalore, IN;
Girish Narasimha Raghavan, Bangalore, IN;
Bopana Ganapathy, Bangalore, IN;
Anil Kumar Sondekoppa Hanumappa, Bangalore, IN;
BMC Software, Houston, TX (US);
Abstract
A monitoring system provided according to an aspect of the present invention enables a user to specify one or more resource elements as a group, and compute an Abnormality Index that represents the deviation from a baseline operation of these selected resource elements. In an embodiment, the Abnormality Index is computed as a single number. The user may include any desired attributes of each resource element to be considered in determining deviations. The Abnormality Index represents the number of deviations, the seriousness of deviation (e.g., more serious if deviation relates to unavailability of the resource element), and the extent of deviation (i.e., whether the deviation is based on expected operation for hourly, daily or weekly duration).