The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2009
Filed:
May. 29, 2007
Andreas Bieswanger, Baden-Württemberg, DE;
Michael S. Floyd, Austin, TX (US);
Andrew J. Geissler, Pflugerville, TX (US);
Soraya Ghiasi, Austin, TX (US);
Hye-young Mccreary, Liberty Hill, TX (US);
Guillermo J. Silva, Austin, TX (US);
Malcolm S. Ware, Austin, TX (US);
Andreas Bieswanger, Baden-Württemberg, DE;
Michael S. Floyd, Austin, TX (US);
Andrew J. Geissler, Pflugerville, TX (US);
Soraya Ghiasi, Austin, TX (US);
Hye-Young McCreary, Liberty Hill, TX (US);
Guillermo J. Silva, Austin, TX (US);
Malcolm S. Ware, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system for identifying a subset of sensors to sample to reduce the frequency of sensor access. The system determines rise times and records values for the sensors in the system. A time criticality of the sensors is determined based on the rise times. The system processes the sensors by first creating sensor subsets based on one or more constraints on the sensors. The system monitors the values of the sensors in a sensor subset and flags a sensor when it makes a determination that, prior to a next scheduled sampling of the sensor subset, the value of a sensor in the monitored sensor subset will exceed a threshold constraint. The system moves those flagged sensors to a second sensor subset which complies with the sensor's constraints.