The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2009
Filed:
Aug. 29, 2007
Jay P. Mccormack, Moscow, ID (US);
Jonathan Cagan, Pittsburgh, PA (US);
Jay P. McCormack, Moscow, ID (US);
Jonathan Cagan, Pittsburgh, PA (US);
Carnegie Mellon University, Pittsburgh, PA (US);
Abstract
Parametric shape recognition is achieved through a decomposition of shapes into a hierarchy of subshapes ordered by their decreasing restrictions. Instances of each of the subshapes are individually located in the design shape and then reconstructed to form an instance of the entire shape. The basis for the hierarchy of subshapes can be specified by the designer or based on the default parameter relations that come from architectural and engineering knowledge. The levels of the hierarchy are defined so that the most constrained lines of a shape are those lines that the designer intended exactly. These most constrained lines have specified parametric relations to other line segments and those relations, if altered, will compromise the designer's intentions. Conversely, the lowest level of the hierarchy, which contains the least constrained line segments, only implies a specific connectivity between line segments, necessitating a vaster search. The parametric recognition of curved line shapes uses a two-step approach that first performs shape matching with an equivalent straight-line shape then checks those transformations for matching with the actual curved lines. This approach has advantages over just matching characteristic polygons in that it can match equivalent curves with differing characteristic polygons as well as emergent shapes.