The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2009
Filed:
May. 19, 2004
Masakazu Suzuki, Yamatokoriyama, JP;
Kouichi Etou, Nara, JP;
Kazunori Miyamoto, Kashihara, JP;
Motohiro Hayashi, Nara, JP;
Yoshikazu Kondoh, Izumiotsu, JP;
Masakazu Suzuki, Yamatokoriyama, JP;
Kouichi Etou, Nara, JP;
Kazunori Miyamoto, Kashihara, JP;
Motohiro Hayashi, Nara, JP;
Yoshikazu Kondoh, Izumiotsu, JP;
Sharp Kabushiki Kaisha, Osaka-shi, JP;
Abstract
Paper () on which a first reference image () is formed in an image forming section (), and a correction instrument () on which a second reference image () is formed, are placed at predetermined positions on an original platen (). Reference images () are read as an image for correction by an image reading section (). An error in the image reading section () is measured based on the second reference image () of the correction image. The first reference image () of the correction image is used to remove the error in the image reading section () from the measured error, resulting in an error in the image forming section ().