The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2009

Filed:

Sep. 15, 2004
Applicants:

Yuan-hsiang Lee, Winchester, MA (US);

William Scott Sutherland, Haverhill, MA (US);

Inventors:

Yuan-Hsiang Lee, Winchester, MA (US);

William Scott Sutherland, Haverhill, MA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for generating a Raman signal of a test sample is disclosed. The apparatus includes a first optical path, a second optical path, a first station, and a second station. The first optical path is adapted for coupling with a radiation source that produces a test beam at the first optical path. The first station is responsive to the test beam and is adapted to house a test standard. The second station is responsive to the test beam and is adapted to house the test sample. In response to the test beam, Raman radiation from the test standard and the test sample are combined and directed to the second optical path, which is adapted for coupling with a spectrometer and a detector for producing a Raman spectrum of the test sample.


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