The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2009
Filed:
Mar. 18, 2005
Yukio Kamoshida, Tokyo, JP;
Yukio Kamoshida, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Provided is an image deformation estimating method capable of obtaining information expressing image deformation between frame images caused by a camera shake with almost no influence of photographing conditions. The image deformation estimating method includes: a first step of providing plural local area in plural frame images, which form a moving image, and obtaining plural pieces of first information indicating movements among the plural frame images in the plural local areas, respectively; a second step of obtaining plural pieces of second information, which express image deformation of each of the plural local areas, using the plural pieces of first information; a third step of preparing plural selected rules, selecting the plural pieces of second information for each of the selected rules, and obtaining second representative information, which represents the selected plural pieces of second information, for each of the selected rules; and a fourth step of using the plural pieces of second representative information, which are obtained for the plural selected rules, to obtain third information expressing deformation of an entire image.