The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2009

Filed:

May. 05, 2006
Applicants:

Yasuhiro Ono, Kyoto, JP;

Masaki Saka, Nabari, JP;

Ayumu Oda, Nara, JP;

Takahisa Narikiyo, Yamatokoriyama, JP;

Inventors:

Yasuhiro Ono, Kyoto, JP;

Masaki Saka, Nabari, JP;

Ayumu Oda, Nara, JP;

Takahisa Narikiyo, Yamatokoriyama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 15/14 (2006.01); B41J 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to the present invention, highly accurate adjustment of the angles and positions of optical elements constituting an optical scanning unit can be easily performed. The optical scanning unit comprises: a first mirror that reflects the light beams emitted from Y, C and M laser diodes; a second mirror that reflects the light beam emitted from a K laser diode and the light beams reflected by the first mirror; a cylindrical lens that acts on the light beams reflected by the second mirror; and a third mirror that reflects the light beams emitted from the cylindrical lens toward a polygon mirror. The second mirror is provided with an adjusting mechanism that can adjust the light beams in the main scanning direction, and the third mirror is provided with an adjusting mechanism that can adjust the light beams in the sub-scanning direction.


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