The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2009
Filed:
Sep. 07, 2007
Clinton J. Thwing, Bulverde, TX (US);
Gary L. Burkhardt, Adkins, TX (US);
Clinton J. Thwing, Bulverde, TX (US);
Gary L. Burkhardt, Adkins, TX (US);
Southwest Research Institute, San Antonio, TX (US);
Abstract
A device and methods for using the device, that permit the rapid and accurate inspection of aircraft wing attachment fittings, including those wing to fuselage attachments modified according to a Structural Life Extension Program (SLEP). Such aircraft life extension programs often result in the placement of fitting stack-up components that tend to challenge the ability of standard inspection sensors and techniques to achieve accurate readings. A specially designed, contact compliant, Electric Current Perturbation (ECP) probe is used. The ECP probe positions a receive coil in conjunction with a drive coil (and its ferrite core) in a manner that minimizes steel interferences in the inspection area. The ECP probe works with conventional eddy current instrumentation with an index scanner to allow for flaw location within a particular stack-up layer and/or within the area around the attachment aperture. Data acquired through the use of the system and method of the present invention allows for the rapid discernment of flaws and defects in the area adjacent the probe placement.