The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2009
Filed:
Sep. 13, 2007
Brian P. Hanley, Davis, CA (US);
Brian P. Hanley, Davis, CA (US);
Other;
Abstract
A method for making suspended microarray readings from a single sample statistically significant in a reliable manner. It can be applied to any assay system that uses discrete particles where the particles are coupled with an assay. Most of these systems suspend the particles in fluid and read the assay result using flow cytometry. However, other methods such as the distribution of tiny assay devices coupled with miniature transponders, where the sampling is of the environment, can also make use of this method. This invention combines multiple separately identified assays of one sample, where the multiple assays are for a single analyte and sets of assays have differing sensitivity to said analyte. By elimination of outliers, averaging, and taking ratios of averages, this method makes possible highly reliable diagnostics. This method compensates for multiple stochastic and non-stochastic sources of errors that can occur in this type of assay system.